CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Frontiers in Electronic Testing, 40)
Product ID: 1402083629
Condition: USED (All books in used condition)
Payflex: Pay in 4 interest-free payments of R1,548.75. Read the FAQ
R 6,195
includes Duties & VAT
Delivery: 10-20 working days
Ships from USA warehouse.
Secure Transaction
VISA
Mastercard
payflex
ozow
Product Description
Condition - Very Good
The item shows wear from consistent use but remains in good condition. It may arrive with damaged packaging or be repackaged.
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Frontiers in Electronic Testing, 40)
The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.
Technical Specifications
Country
USA
Brand
Springer
Manufacturer
Springer
Binding
Hardcover
ItemPartNumber
23539913
Model
23539913
ReleaseDate
2008-06-21T00:00:01Z
UnitCount
1
EANs
9781402083624
