Springer
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Frontiers in Electronic Testing, 40)
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Description
Condition - Very Good
The item shows wear from consistent use but remains in good condition. It may arrive with damaged packaging or be repackaged.
The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.
Technical Specifications
Manufacturer
Springer
Model
23539913
Release date
21 June 2008
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Your order is shipped from the USA and delivered to your door in South Africa in 10–20 working days. All items are fully tracked.
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