Characterization Methods for Submicron MOSFETs (The Springer International Series in Engineering and Computer Science)

Characterization Methods for Submicron MOSFETs (The Springer International Series in Engineering and Computer Science)

Product ID: 1461285844 Condition: USED (All books in used condition)

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Product Description

Condition - Very Good

The item shows wear from consistent use but remains in good condition. It may arrive with damaged packaging or be repackaged.

Characterization Methods for Submicron MOSFETs (The Springer International Series in Engineering and Computer Science)

Technical Specifications

Country
USA
Brand
Springer
Manufacturer
Springer
Binding
Paperback
ItemPartNumber
biography
ReleaseDate
2011-09-26T00:00:01Z
UnitCount
1
Format
Illustrated
EANs
9781461285847