Books > Engineering & Transportation > Engineering > Electrical & Electronics > Electronics > Semiconductors
Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
Product ID: 1441935746
Condition: USED (All books in used condition)
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Product Description
Condition - Very Good
The item shows wear from consistent use but remains in good condition. It may arrive with damaged packaging or be repackaged.
Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
Technical Specifications
Country
USA
Brand
Springer
Manufacturer
Springer
Binding
Paperback
ItemPartNumber
193 black & white illustrations
ReleaseDate
2010-10-29T00:00:01Z
UnitCount
1
EANs
9781441935748
