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Materials & Material Science

Materials Science

SCANNING TRANSMISSION ELECTRON MICROSCOPY OF NANOMATERIALS: BASICS OF IMAGING AND ANALYSIS

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SCANNING TRANSMISSION ELECTRON MICROSCOPY OF NANOMATERIALS: BASICS OF IMAGING AND ANALYSIS

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
Readership: Graduate students and researchers in the field of nanomaterials and nanostructures.
Country USA
Brand Imperial College Press
Manufacturer Imperial College Pr
Binding Hardcover
UnitCount 1
EANs 9781848167896
ReleaseDate 0000-00-00

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