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Spectroscopic Ellipsometry and Reflectometry: A User's Guide

Condition: USED (All books are in used condition)

Condition - Very Good
The item shows wear from consistent use, but it remains in good condition and functions properly. Item may arrive with damaged packaging or be repackaged. It may be marked, have identifying markings on it, or have minor cosmetic damage. It may also be missing some parts/accessories or bundled items.

Spectroscopic Ellipsometry and Reflectometry: A User's Guide

While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. A guide for practitioners and researchers in a variety of disciplines, it addresses a broad range of applications in physics, chemistry, electrical engineering, and materials science.
Country USA
Brand Wiley
Manufacturer Wiley-Interscience
Binding Hardcover
ItemPartNumber 9780471181729
UnitCount 1
EANs 9780471181729
ReleaseDate 0000-00-00

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