Spectroscopic Ellipsometry and Reflectometry: A User's Guide
Product ID: 0471181722
Condition: USED (All books in used condition)
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Condition - Very Good
The item shows wear from consistent use but remains in good condition. It may arrive with damaged packaging or be repackaged.
Spectroscopic Ellipsometry and Reflectometry: A User's Guide
While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. A guide for practitioners and researchers in a variety of disciplines, it addresses a broad range of applications in physics, chemistry, electrical engineering, and materials science.
Technical Specifications
Country
USA
Brand
Wiley
Manufacturer
Wiley-Interscience
Binding
Hardcover
ItemPartNumber
9780471181729
UnitCount
1
EANs
9780471181729
