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Thin Film and Depth Profile Analysis (Topics in Current Physics)

Condition: USED (All books are in used condition)

Condition - Very Good
The item shows wear from consistent use, but it remains in good condition and functions properly. Item may arrive with damaged packaging or be repackaged. It may be marked, have identifying markings on it, or have minor cosmetic damage. It may also be missing some parts/accessories or bundled items.

Thin Film and Depth Profile Analysis (Topics in Current Physics)
- Used Book in Good Condition
Country USA
Brand Springer
Manufacturer Springer
Binding Paperback
ItemPartNumber biography
ReleaseDate 2012-03-27
UnitCount 1
EANs 9783642465017

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Country	USA
Brand	Springer
Manufacturer	Springer
Binding	Paperback
ItemPartNumber	biography
ReleaseDate	2012-03-27
UnitCount	1
EANs	9783642465017