VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
Product ID: 0123705975
Condition: USED (All books in used condition)
Payflex: Pay in 4 interest-free payments of R619.00. Read the FAQ
R 2,476
includes Duties & VAT
Delivery: 10-20 working days
Ships from USA warehouse.
Secure Transaction
VISA
Mastercard
payflex
ozow
Product Description
Condition - Very Good
The item shows wear from consistent use but remains in good condition. It may arrive with damaged packaging or be repackaged.
VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
- Most up-to-date coverage of design for testability.
- Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.Â
- Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Technical Specifications
Country
USA
Brand
Morgan Kaufmann
Manufacturer
Morgan Kaufmann
Binding
Hardcover
ItemPartNumber
YES2043034
Model
YES2043034
UnitCount
1
EANs
9780123705976
