Elsevier
VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
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Description
Condition - Very Good
The item shows wear from consistent use but remains in good condition. It may arrive with damaged packaging or be repackaged.
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
- Most up-to-date coverage of design for testability.
- Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.Â
- Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Technical Specifications
Manufacturer
Morgan Kaufmann
Model
YES2043034
Height
23.8 cm
Length
20.6 cm
Width
5.2 cm
Weight
1.79 kg
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