X-ray Microscopy (Advances in Microscopy and Microanalysis)

Condition - Very Good
The item shows wear from consistent use, but it remains in good condition and functions properly. Item may arrive with damaged packaging or be repackaged. It may be marked, have identifying markings on it, or have minor cosmetic damage. It may also be missing some parts/accessories or bundled items.

X-ray Microscopy (Advances in Microscopy and Microanalysis)

Written by a pioneer in the field, this text provides a complete introduction to X-ray microscopy, providing all of the technical background required to use, understand and even develop X-ray microscopes. Starting from the basics of X-ray physics and focusing optics, it goes on to cover imaging theory, tomography, chemical and elemental analysis, lensless imaging, computational methods, instrumentation, radiation damage, and cryomicroscopy, and includes a survey of recent scientific applications. Designed as a 'one-stop' text, it provides a unified notation, and shows how computational methods in different areas are linked with one another. Including numerous derivations, and illustrated with dozens of examples throughout, this is an essential text for academics and practitioners across engineering, the physical sciences and the life sciences who use X-ray microscopy to analyze their specimens, as well as those taking courses in X-ray microscopy.
Country USA
Brand Cambridge University Press
Manufacturer Cambridge University Press
Binding Hardcover
ItemPartNumber 9781107076570
UnitCount 1
EANs 9781107076570
ReleaseDate 0000-00-00

Country	USA
Brand	Cambridge University Press
Manufacturer	Cambridge University Press
Binding	Hardcover
ItemPartNumber	9781107076570
UnitCount	1
EANs	9781107076570
ReleaseDate	0000-00-00

X-ray Microscopy (Advances in Microscopy and Microanalysis)

Customers who purchased this also purchased....