Design-For-Test for Digital Ic's & Embedded Core Systems
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Design-For-Test for Digital Ic's & Embedded Core Systems
Provides testing strategies that address business needs for quality, reliability, and cost control. This book helps to optimize the engineering trade-offs between resources such as silicon area, operating frequency, and power consumption. Focusing on automatic test pattern generation (ATPG), it is for the engineers involved in design and testing.
