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VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))

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The item shows wear from consistent use, but it remains in good condition and functions properly. Item may arrive with damaged packaging or be repackaged. It may be marked, have identifying markings on it, or have minor cosmetic damage. It may also be missing some parts/accessories or bundled items.

VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
- Most up-to-date coverage of design for testability.
- Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.Â
- Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Country USA
Brand Morgan Kaufmann
Manufacturer Morgan Kaufmann
Binding Hardcover
ItemPartNumber YES2043034
Model YES2043034
UnitCount 1
EANs 9780123705976
ReleaseDate 0000-00-00

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