Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)

Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)

Product ID: 0849394503 Condition: USED (All books in used condition)

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Condition - Very Good

The item shows wear from consistent use but remains in good condition. It may arrive with damaged packaging or be repackaged.

Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)

Technical Specifications

Country
USA
Brand
CRC Press
Manufacturer
CRC Press
Binding
Hardcover
UnitCount
1
EANs
9780849394508