Microelectronics Failure Analysis Desk Reference (Book + CD

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Microelectronics Failure Analysis Desk Reference (Book + CD set)

This updated reference book, prepared by experts in their fields, contains dozens of articles covering a wide range of topics involving the failure analysis of microelectronics. It places the most important and up-to-date information on this subject at your fingertips. Topic coverage includes: Failure Analysis Process Flow, Failure Verification, Failure Modes and Failure Classification, Special Devices (MEMS, Optoelectronics, Passives, Fault Localization Techniques: Package Level (NDT), Die Level (Depackaging, Photon Emission, Microthermography, Laser-Based Methods, Particle Beam Methods, Deprocessing & Imaging Techniques: Deprocessing, General Imaging Techniques, Local Deprocessing & Imaging, Circuit Edit and Design Modification, Material Analysis Techniques, Reference Information: Important Topics for Semiconductor Devices, Failure Analysis Techniques Roadmap, Failure Analysis Operations and Management, Appendices: Failure Analysis Terms, Definitions, and Acronyms, Industry Standards

Country	USA
Author	EDFAS Desk Reference Committee
Binding	Hardcover
EAN	9781615037254
Edition	6th edition
ISBN	161503725X
IsEligibleForTradeIn	1
Label	ASM International
Manufacturer	ASM International
NumberOfItems	1
NumberOfPages	674
PublicationDate	2011-11-01
Publisher	ASM International
Studio	ASM International
ReleaseDate	0000-00-00

Microelectronics Failure Analysis Desk Reference (Book + CD set)