Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003
Country | USA |
Brand | Routledge |
Manufacturer | Routledge |
Binding | Hardcover |
ItemPartNumber | 34 b/w halftones, 9 b/w line drawings |
UnitCount | 1 |
EANs | 9780415166188 |
ReleaseDate | 0000-00-00 |