Reliability of Electronic Packages and Semiconductor Devices
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Reliability of Electronic Packages and Semiconductor Devices
Reliability issues are a hot topic in the global electronics industry, and here at last is a precise tutorial on predicting and extending the functional life of semiconductor components--the first book on this extremely important subject. Using empirical modeling, Di Giacomo expertly covers all major types of failure mechanisms that can greatly reduce the active life of semiconductor components, including interconnection fatigue and electromigration. He also shows how to use statistical analysis to project failure rates. By cutting across different technologies and materials, this unique text will prove invaluable to engineers in the numerous fields that rely on semiconductor components.
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